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浏览/检索结果: 共7条，第1-7条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 MVSE: Effort-Aware Heterogeneous Defect Prediction via Multiple-View Spectral Embedding 会议论文 作者:  Xu, Zhou;  Ye, Sizhe;  Zhang, Tao;  Xia, Zhen;  Pang, Shuai 收藏  |  浏览/下载：7/0  |  提交时间：2019/12/05 Cross Project Defect Prediction via Balanced Distribution Adaptation Based Transfer Learning 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2019, 卷号: 34, 期号: 5 作者:  Xu, Zhou;  Pang, Shuai;  Zhang, Tao;  Luo, Xia-Pu;  Liu, Jin 收藏  |  浏览/下载：11/0  |  提交时间：2019/12/05 cross-project defect prediction  transfer learning  balancing distribution  effort-aware indicator   An Empirical Study of Learning to Rank Techniques for Effort-Aware Defect Prediction 会议论文 作者:  Yu, Xiao;  Bennin, Kwabena Ebo;  Liu, Jin;  Keung, Jacky Wai;  Yin, Xiaofei 收藏  |  浏览/下载：13/0  |  提交时间：2019/12/05 An Empirical Study of Learning to Rank Techniques for Effort-Aware Defect Prediction 其他 2019-01-01 作者:  Yu, Xiao;  Bennin, Kwabena Ebo;  Liu, Jin;  Keung, Jacky Wai;  Yin, Xiaofei 收藏  |  浏览/下载：13/0  |  提交时间：2019/12/05 effort-aware defect prediction  learning to rank  empirical study  Scott-Knott ESD test   Poster: Bridging effort-Aware prediction and strong classification: A just-in-Time software defect prediction study 会议论文 作者:  Guo, Yuchen;  Shepperd, Martin;  Li, Ning 收藏  |  浏览/下载：5/0  |  提交时间：2019/11/26 Classification performance  Defect classification  Defect prediction  Effort-Aware  Just in time  Skewed distribution  Software defect prediction  Suboptimal solution   Progress on approaches to software defect prediction 期刊论文 IET SOFTWARE, 2018, 卷号: 12, 期号: 3 作者:  Li, Zhiqiang;  Jing, Xiao-Yuan;  Zhu, Xiaoke 收藏  |  浏览/下载：5/0  |  提交时间：2019/12/05 software quality  software reliability  quality assurance  research and development  software defect prediction  software engineering journals  defect-prone software modules  software quality assurance  machine learning-based prediction algorithms  data manipulation  effort-aware prediction  empirical studies   Code churn: A neglected metric in effort-aware just-in-time defect prediction 会议论文 11TH ACM/IEEE INTERNATIONAL SYMPOSIUM ON EMPIRICAL SOFTWARE ENGINEERING AND MEASUREMENT (ESEM 2017), 2017-01-01 作者:  Liu, Jinping[1];  Zhou, Yuming[2];  Yang, Yibiao[3];  Lu, Hongmin[4];  Xu, Baowen[5] 收藏  |  浏览/下载：2/0  |  提交时间：2019/12/24 Defect  prediction  changes  just-in-time  code churn  unsupervised models  supervised models