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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 内容类型：其他     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era 其他 2015-01-01 Ren, Pengpeng; Wang, Runsheng; Ji, Zhigang; Hao, Peng; Jiang, Xiaobo; Guo, Shaofeng; Luo, Mulong; Duan, Meng; Zhang, Jian F.; Wang, Jianping; Liu, Jinhua; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Xu, Nuo; Huang, Ru 收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03 Deep understanding of AC RTN in MuGFETs through new characterization method and impacts on logic circuits 其他 2013-01-01 Zou, Jibin; Wang, Runsheng; Luo, Mulong; Huang, Ru; Xu, Nuo; Ren, Pengpeng; Liu, Changze; Xiong, Weize; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13 New insights into AC RTN in scaled high-��/ metal-gate MOSFETs under digital circuit operations 其他 2012-01-01 Zou, Jibin; Wang, Runsheng; Gong, Nanbo; Huang, Ru; Xu, Xiaoqing; Ou, Jiaojiao; Liu, Changze; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Yu, Shaofeng; Ren, Pengpeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan 收藏  |  浏览/下载：7/0  |  提交时间：2015/11/13 On the statistical trap-response (STR) method for characterizing random trap occupancy and NBTI fluctuation 其他 2012-01-01 Zou, Jibin; Liu, Changze; Wang, Runsheng; Xu, Xiaoqing; Liu, Jinhua; Wu, Hanming; Wang, Yangyuan; Huang, Ru 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13 Towards the Systematic Study of Aging Induced Dynamic Variability in nano-MOSFETs: Adding the Missing Cycle-to-Cycle Variation Effects into Device-to-Device Variation 其他 2011-01-01 Liu, Changze; Zou, Jibin; Wang, Runsheng; Huang, Ru; Xu, Xiaoqing; Liu, Jinhua; Wu, Hanming; Wang, Yangyuan 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10