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CORC

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STABILITY OF HALF-DEGREE POINT DEFECT PROFILES FOR 2-D NEMATIC LIQUID CRYSTAL 其他
2017-01-01
Geng, Zhiyuan; Wang, Wei; Zhang, Pingwen; Zhang, Zhifei
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Fabrication of 1.5mm thickness silicon pin fast neutron detector with guard ring structure 其他
2016-01-01
Zhang, Zhao; Yu, Min; Zhu, Zhiyuan; Wang, Hao; Huang, Yahuan; Jin, Yufeng
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions 其他
2016-01-01
Li, Yun; Jiang, Hai; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Hao, Hao; Du, Gang; Zhang, Xing; Liu, Xiaoyan
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
FABRICATION OF 1.5MM THICKNESS SILICON PIN FAST NEUTRON DETECTOR WITH GUARD RING STRUCTURE 其他
2016-01-01
Zhang, Zhao; Yu, Min; Zhu, Zhiyuan; Wang, Hao; Huang, Yahuan; Jin, Yufeng
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Evaulation the Degradation in nMOSFETs with HfO2 Gate Dielectric and Interfacial Layer by 3D Kinetic Monte-Carlo Method 其他
2016-01-01
Li, Yun; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Jiang, Hai; Zhang, Xing; Du, Gang; Liu, Xiaoyan
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Improvement of DRIE simulation method for process development application 其他
2015-01-01
Du, Hong; Yu, Min; Qi, Lin; Zhu, Zhiyuan; Wang, Hao; Zhang, Haixia; Jin, Yufeng; Shi, Baohua; Zhang, Zhao
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Improvement of DRIE simulation method for process development application 其他
2015-01-01
Du, Hong; Yu, Min; Qi, Lin; Zhu, Zhiyuan; Wang, Hao; Zhang, Haixia; Jin, Yufeng; Shi, Baohua; Zhang, Zhao
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Investigation of the impact of grain boundary on threshold voltage of 3-D MLC NAND flash memory 其他
2015-01-01
Lun, Zhiyuan; Shen, Lei; Cong, Yingying; Du, Gang; Liu, Xiaoyan; Wang, Yi
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Temporary bonding/debonding based on propylene carbonate 其他
2015-01-01
Zhu, Zhiyuan; Du, Hong; Guan, Yong; Wang, Hao; Yu, Min; Jin, Yufeng; Zhang, Zhao
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
3D KMC reliability simulation of nano-scaled HKMG nMOSFETs with multiple traps coupling 其他
2015-01-01
Li, Yun; Lun, Zhiyuan; Huang, Peng; Wang, Yijiao; Jiang, Hai; Du, Gang; Liu, Xiaoyan
收藏  |  浏览/下载：8/0  |  提交时间：2017/12/03

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