Direct Determination of Band Gap of Defects in a Wide Band Gap Semiconductor | |
Yan, Xuexi2,3; Jin, Qianqian1; Jiang, Yixiao2,3; Yao, Tingting2,3; Li, Xiang2,3; Tao, Ang2,3; Gao, Chunyang2,3; Chen, Chunlin2,3; Ma, Xiuliang2,4; Ye, Hengqiang3 | |
刊名 | ACS APPLIED MATERIALS & INTERFACES |
2022-08-17 | |
卷号 | 14期号:32页码:36875-36881 |
关键词 | IDBs band gap transmission electron microscopy electron energy-loss spectroscopy first-principles calculations AlN |
ISSN号 | 1944-8244 |
DOI | 10.1021/acsami.2c10143 |
英文摘要 | Crystal defects play an important role in the degradation and failure of semiconductor materials and devices. Direct determination of band gap of defects is a critical step for clarifying how the defects affect the physical properties of films were grown epitaxially on single-crystal Al2O3 substrates via pulsed laser deposition. The atomic structure and band gap of three types of inversion domain boundaries (IDBs) in AlN were determined using aberration-corrected transmission electron spectroscopy. It was found that the band gap of all of the IDBs reduces evidently compared to that of the bulk AlN. The maximum band gap reduction of the IDBs is 1.0 eV. First-principles calculations revealed that the band gap reduction of the IDBs is mainly due to the rise of pz orbital at the valence band maximum, which originates from the elongated Al-N bonds along the [0001] direction at the IDBs. The successful band gap determination of defects paves an avenue for quantitatively evaluating the effect of defects on the performance of semiconductor materials and devices. |
WOS研究方向 | Science & Technology - Other Topics ; Materials Science |
语种 | 英语 |
出版者 | AMER CHEMICAL SOC |
WOS记录号 | WOS:000837853800001 |
内容类型 | 期刊论文 |
源URL | [http://ir.lut.edu.cn/handle/2XXMBERH/159855] |
专题 | 材料科学与工程学院_特聘教授组 |
作者单位 | 1.Guangxi Univ Sci & Technol, Sch Microelect & Mat Engn, Liuzhou 545006, Peoples R China; 2.Univ Sci & Technol China, Inst Met Res, Chinese Acad Sci, Sch Mat Sci & Engn,Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China; 3.Jihua Lab, Foshan 528251, Peoples R China; 4.Lanzhou Univ Technol, State Key Lab Adv Proc & Recycling Nonferrous Met, Lanzhou 730050, Peoples R China |
推荐引用方式 GB/T 7714 | Yan, Xuexi,Jin, Qianqian,Jiang, Yixiao,et al. Direct Determination of Band Gap of Defects in a Wide Band Gap Semiconductor[J]. ACS APPLIED MATERIALS & INTERFACES,2022,14(32):36875-36881. |
APA | Yan, Xuexi.,Jin, Qianqian.,Jiang, Yixiao.,Yao, Tingting.,Li, Xiang.,...&Ye, Hengqiang.(2022).Direct Determination of Band Gap of Defects in a Wide Band Gap Semiconductor.ACS APPLIED MATERIALS & INTERFACES,14(32),36875-36881. |
MLA | Yan, Xuexi,et al."Direct Determination of Band Gap of Defects in a Wide Band Gap Semiconductor".ACS APPLIED MATERIALS & INTERFACES 14.32(2022):36875-36881. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论