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Characterization of Multi-field Behaviors on Fatigue Damage Due to High Cyclic Loading in YBCO-Coated Conductors Fabricated by the IBAD-PLD Technology
Pan, Yuanzhou1,3; Guan, Mingzhi1,2,3
刊名JOURNAL OF LOW TEMPERATURE PHYSICS
2022-02-23
页码18
关键词YBCO-coated conductors Multi-field behaviors Fatigue damage High cyclic loading Microstructure
ISSN号0022-2291
DOI10.1007/s10909-022-02693-0
通讯作者Guan, Mingzhi(mzg615@impcas.ac.cn)
英文摘要In practice, yttrium barium copper oxide (YBCO) tapes often experience different types of fatigue loadings including continuous winding stress, repeated thermal cycles, and periodic electromagnetic force, consequently resulting in a poor performance. Based on cyclic loading tests in the structural design of some large YBCO superconducting devices, a 95% critical current (I-c) retention tensile stress criterion was proposed. Although the relationship between critical current and stress/strain has been extensively studied by some research teams, the effects of fatigue loading on macro-behavior, microstructure, and electromechanical responses have not been much reported. In this paper, the tapes were made using ion-beam-assisted deposition combined with pulsed laser deposition. Under the self-field, they were subjected to many cycles of axial loading to test their fatigue behavior. In this work, first, we report the effects of fatigue numbers on YBCO tapes' tensile responses (e.g., Tensile Strengths) and electromechanical behaviors. Macro-behavior measurements showed that the mechanical behaviors and their electromechanical degradation of YBCO superconducting tapes depended on the number of fatigue loading cycles. Then, fracture surface morphologies of YBCO tapes' superconducting layer and Hastelloy layer were also investigated with scanning electron microscope and energy-dispersive X-ray spectroscopy. It was found that the width of scratch lines and the size of fatigue defects on Hastelloy layer were increased with the number of fatigue cycles, which was the main cause of the degradation of mechanical properties. Moreover, observations of the microstructure conducted on the YBCO layer demonstrated that it was the crack motion and evolution that led to the current degradation under fatigue loading. During the process of fatigue loading, the small fatigue cracks become big with the increasing fatigue number. Lastly, a critical current-strain model of the fatigued HTS tapes, that combines the Ekin power-law formula and the Weibull distribution function, is proposed. This model can predict the electromechanical property of fatigued YBCO tapes under uniaxial tensile strain well.
资助项目National Natural Science Foundation of China[12172357] ; Youth Innovation Promotion Association CAS[2019404] ; CAS Light of West China Program (2018)
WOS关键词CRITICAL CURRENTS ; TAPES ; TEMPERATURE ; DEGRADATION ; STRAIN ; WIRES
WOS研究方向Physics
语种英语
出版者SPRINGER/PLENUM PUBLISHERS
WOS记录号WOS:000759354100003
资助机构National Natural Science Foundation of China ; Youth Innovation Promotion Association CAS ; CAS Light of West China Program (2018)
内容类型期刊论文
源URL[http://119.78.100.186/handle/113462/142026]  
专题中国科学院近代物理研究所
通讯作者Guan, Mingzhi
作者单位1.Adv Energy Sci & Technol Guangdong Lab, Huizhou 516000, Peoples R China
2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
3.Lanzhou Univ, Minist Educ, Coll Civil Engn & Mech, Key Lab Mech Western Disaster & Environm, Lanzhou 730000, Peoples R China
推荐引用方式
GB/T 7714
Pan, Yuanzhou,Guan, Mingzhi. Characterization of Multi-field Behaviors on Fatigue Damage Due to High Cyclic Loading in YBCO-Coated Conductors Fabricated by the IBAD-PLD Technology[J]. JOURNAL OF LOW TEMPERATURE PHYSICS,2022:18.
APA Pan, Yuanzhou,&Guan, Mingzhi.(2022).Characterization of Multi-field Behaviors on Fatigue Damage Due to High Cyclic Loading in YBCO-Coated Conductors Fabricated by the IBAD-PLD Technology.JOURNAL OF LOW TEMPERATURE PHYSICS,18.
MLA Pan, Yuanzhou,et al."Characterization of Multi-field Behaviors on Fatigue Damage Due to High Cyclic Loading in YBCO-Coated Conductors Fabricated by the IBAD-PLD Technology".JOURNAL OF LOW TEMPERATURE PHYSICS (2022):18.
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