Influence of enhanced low dose rate sensitivity on single-event transient degradation in the LM158 bipolar operational amplifier
Xiang, CAF (Xiang, Chuanfeng) 1 , 2; Yao, S (Yao, Shuai) 1 , 3; Lu, W (Lu, Wu) 1 , 2; Li, XL (Li, Xiaolong) 1; Yu, X (Yu, Xin) 1; Wang, X (Wang, Xin) 1; Liu, MH (Liu, Mohan) 1; Sun, J (Sun, Jing) 1; Guo, Q (Guo, Qi) 1
刊名AIP ADVANCES
2021
卷号11期号:5页码:1-6
ISSN号2158-3226
DOI10.1063/5.0052439
英文摘要

The synergistic effect of enhanced low dose rate sensitivity and single-event transients (SETs) in the bipolar dual operational amplifier LM158 is studied. The test results show a significant reduction in the SET amplitude and broadening in the SET waveform upon exposure to total ionizing dose radiation. These results are much more prominent for a low dose rate (LDR) irradiation of 0.01 rad(Si)/s than for a high dose rate irradiation of 10 rad(Si)/s. The greater gain degradation in the LM158 with LDR irradiation could be the direct cause of the reduction in the SET amplitude and broadening in the SET waveform, and this is corroborated through HSPICE simulations.

WOS记录号WOS:000675209500005
内容类型期刊论文
源URL[http://ir.xjipc.cas.cn/handle/365002/7874]  
专题新疆理化技术研究所_中国科学院特殊环境功能材料与器件重点试验室
通讯作者Lu, W (Lu, Wu) 1 , 2
作者单位1.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
2.Xinjiang Univ, Sch Phys Sci & Technol, Urumqi 830046, Peoples R China
3.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Xinjiang Key Lab Elect Informat Mat & Device, Urumqi 830011, Peoples R China
推荐引用方式
GB/T 7714
Xiang, CAF ,Yao, S ,Lu, W ,et al. Influence of enhanced low dose rate sensitivity on single-event transient degradation in the LM158 bipolar operational amplifier[J]. AIP ADVANCES,2021,11(5):1-6.
APA Xiang, CAF .,Yao, S .,Lu, W .,Li, XL .,Yu, X .,...&Guo, Q .(2021).Influence of enhanced low dose rate sensitivity on single-event transient degradation in the LM158 bipolar operational amplifier.AIP ADVANCES,11(5),1-6.
MLA Xiang, CAF ,et al."Influence of enhanced low dose rate sensitivity on single-event transient degradation in the LM158 bipolar operational amplifier".AIP ADVANCES 11.5(2021):1-6.
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