The environmental stability characterization of exfoliated few-layer CrXTe3 (X = Si, Ge) nanosheets

doi:10.1016/j.apsusc.2020.145452

	The environmental stability characterization of exfoliated few-layer CrXTe3 (X = Si, Ge) nanosheets
	Liu, Yun 1; Wang, Wei 2; Lu, Haoyong 1; Xie, Qiyun 1,4; Chen, Limin 1; Yin, Handi 3; Cheng, Guofeng 3; Wu, Xiaoshan 4
刊名	APPLIED SURFACE SCIENCE
	2020-05-01
卷号	511 页码:6
关键词	CrSiTe3 CrGeTe3 Environmental stability Raman spectra
ISSN号	0169-4332
DOI	10.1016/j.apsusc.2020.145452
通讯作者	Xie, Qiyun(qyxie@njupt.edu.cn) ; Cheng, Guofeng(gfcheng@mail.sic.ac.cn)
英文摘要	Two dimensional van der Waals layered CrXTe3 (X = Si, Ge) crystals have attracted great attention recently due to the observation of fascinating long range magnetic order. However, the detailed environmental stability of surface chemical reactivity of CrXTe3 has not been explored yet. Herein, we have studied the ambient air oxidation of exfoliated few-layer CrXTe3 (X = Si, Ge) nanosheets using optical microscopy, atomic force microscopy and Raman spectra. The optical contrast decreases, and surface roughness and thickness increase with exposure time for few-layer CrXTe3. The stability of CrGeTe3 flakes is superior to that of CrSiTe3. CrSiTe3 nanosheets degrade almost immediately after exposure to air, while CrGeTe3 above 11 nm can be air stable for 24 h. Under high power laser excitation or exposure to the air for sufficient time, it is found that amorphous Te and TeO(x )are formed initially and continually converted to TeO2, resulting in the degradation of CrXTe3. Our results shed light on environmental effects on the surface evolution of CrXTe3 and highlight the need for developing suitable protecting strategies in future CrXTe3-based devices.
资助项目	National Natural Science Foundation of China[11404169] ; National Natural Science Foundation of China[51602159] ; National Natural Science Foundation of China[11704196] ; Scientific Research Foundation of Nanjing University of Posts & Telecommunications[NY217043] ; Scientific Research Foundation of Nanjing University of Posts & Telecommunications[NY218021] ; Postgraduate Research & Practice Innovation Program of Jiangsu Province[SJCX18_0287] ; Postgraduate Research & Practice Innovation Program of Jiangsu Province[SJCX19_0278]
WOS关键词	FERROMAGNETISM ; DEFECTS ; CRYSTAL ; MOTE2
WOS研究方向	Chemistry ; Materials Science ; Physics
语种	英语
出版者	ELSEVIER
WOS记录号	WOS:000517883800091
内容类型	期刊论文
源URL	[http://119.78.100.183/handle/2S10ELR8/281527]
专题	中国科学院上海药物研究所
通讯作者	Xie, Qiyun; Cheng, Guofeng
作者单位	1.Nanjing Univ Posts & Telecommun, Coll Elect & Opt Engn, Key Lab Radio Frequency & Micronano Elect Jiangsu, Nanjing 210023, Peoples R China 2.Nanjing Tech Univ, Jiangsu Natl Synerget Innovat Ctr Adv Mat, Key Lab Flexible Elect & Inst Adv Mat, Nanjing 211816, Peoples R China 3.Chinese Acad Sci, Anal & Testing Ctr Inorgan Mat, Shanghai Inst Ceram, Shanghai 200050, Peoples R China 4.Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
推荐引用方式 GB/T 7714	Liu, Yun,Wang, Wei,Lu, Haoyong,et al. The environmental stability characterization of exfoliated few-layer CrXTe3 (X = Si, Ge) nanosheets[J]. APPLIED SURFACE SCIENCE,2020,511:6.
APA	Liu, Yun.,Wang, Wei.,Lu, Haoyong.,Xie, Qiyun.,Chen, Limin.,...&Wu, Xiaoshan.(2020).The environmental stability characterization of exfoliated few-layer CrXTe3 (X = Si, Ge) nanosheets.APPLIED SURFACE SCIENCE,511,6.
MLA	Liu, Yun,et al."The environmental stability characterization of exfoliated few-layer CrXTe3 (X = Si, Ge) nanosheets".APPLIED SURFACE SCIENCE 511(2020):6.