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	Methods, systems, and devices for burn-in testing of optoelectronic devices
	CHEN, FANG-ZHONG; CAI, WEI; CHEN, JOHN; LEI, CHUN; SHIH, ROBERT
	2004-07-15
著作权人	FINISAR CORPORATION
专利号	US20040135595A1
国家	美国
文献子类	发明申请
其他题名	Methods, systems, and devices for burn-in testing of optoelectronic devices
英文摘要	System and methods for life testing laser diodes is disclosed. The system includes a burn-in rack having a plurality of optoelectronic devices mounted within respective holders and electrical signal connectors that electrically couple the optoelectronic devices to a first electrical connector. A test apparatus holds the burn-in rack and has optical detectors arranged to receive electromagnetic radiation from the mounted optoelectronic devices and couple the output signals from the optical detectors to a second electrical connector. A computer electrically communicates with the connectors and generates a drive current deliverable to each optoelectronic device and receives data from the optical detectors that is based upon the output from each optoelectronic device. The measured optical power output from each optoelectronic device is stored at the computer and following analysis the optoelectronic devices are either removed from the rack or subjected to additional burn-in processes.
公开日期	2004-07-15
申请日期	2003-10-29
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/51394]
专题	半导体激光器专利数据库
作者单位	FINISAR CORPORATION
推荐引用方式 GB/T 7714	CHEN, FANG-ZHONG,CAI, WEI,CHEN, JOHN,et al. Methods, systems, and devices for burn-in testing of optoelectronic devices. US20040135595A1. 2004-07-15.

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