Scan chain design for shift power reduction in scan-based testing

doi:10.1007/s11432-011-4205-z

CORC > 计算技术研究所 > 中国科学院计算技术研究所 > 中国科学院计算技术研究所期刊论文 > 英文

	Scan chain design for shift power reduction in scan-based testing
	Li Jia 2; Hu Yu 1; Li XiaoWei 1
刊名	SCIENCE CHINA-INFORMATION SCIENCES
	2011-04-01
卷号	54 期号:4 页码:767-777
关键词	low power DfT scan-based testing test power reduction scan chain design
ISSN号	1674-733X
DOI	10.1007/s11432-011-4205-z
英文摘要	Test power of VLSI systems has become a challenging issue nowadays. The scan shift power dominates the average test power and restricts clock frequency of the shift phase, leading to excessive thermal accumulation and long test time. This paper proposes a scan chain design technique to solve the above problems. Based on weighted transition metric (WTM), the proposed extended WTM (EWTM) that is utilized to guide the scan chain design algorithm can estimate the scan shift power in both the shift-in and shift-out phases. Moreover, the wire length overhead of the proposed scan chain design can also be reduced by the proposed distance of EWTM (DEWTM) metric. Experimental results confirm that the proposed approach can significantly reduce scan shift power with low wire length overhead.
资助项目	National Natural Science Foundation of China[60633060] ; National Natural Science Foundation of China[60803031] ; National Natural Science Foundation of China[61006017] ; National Basic Research Program of China[2005CB321604] ; National High-Tech Research & Development Program of China[2007AA01Z107] ; National High-Tech Research & Development Program of China[2007AA01Z113] ; National High-Tech Research & Development Program of China[2007AA01Z109] ; National High-Tech Research & Development Program of China[2009AA01Z129] ; National Science Foundation of China[60425203] ; National Science Foundation of China[60910003] ; Key Laboratory of Computer System and Architecture, ICT, CAS[ICT-ARCH200902] ; China Postdoctoral Science Foundation[20100470014]
WOS研究方向	Computer Science
语种	英语
出版者	SCIENCE CHINA PRESS
WOS记录号	WOS:000289902100006
内容类型	期刊论文
源URL	[http://119.78.100.204/handle/2XEOYT63/12575]
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Li Jia
作者单位	1.Chinese Acad Sci, Inst Comp Technol, Beijing 100190, Peoples R China 2.Tsinghua Univ, Sch Software, Beijing 100084, Peoples R China
推荐引用方式 GB/T 7714	Li Jia,Hu Yu,Li XiaoWei. Scan chain design for shift power reduction in scan-based testing[J]. SCIENCE CHINA-INFORMATION SCIENCES,2011,54(4):767-777.
APA	Li Jia,Hu Yu,&Li XiaoWei.(2011).Scan chain design for shift power reduction in scan-based testing.SCIENCE CHINA-INFORMATION SCIENCES,54(4),767-777.
MLA	Li Jia,et al."Scan chain design for shift power reduction in scan-based testing".SCIENCE CHINA-INFORMATION SCIENCES 54.4(2011):767-777.