Frequency limitation in calibrating microwave test fixtures

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	Frequency limitation in calibrating microwave test fixtures
	Qian C ; Wang YL ; Chen ZY ; Zhu NH
	2002
会议名称	3rd international conference on microwave and millimeter wave technology
会议日期	aug 17-19, 2002
会议地点	beijing, peoples r china
关键词	calibration microwave network analyzer scattering-parameter measurement phase uncertainty NETWORK-ANALYZER CALIBRATION
页码	146-149
通讯作者	qian c cas state key lab integrated optoelect inst semicond beijing 100083 peoples r china.
中文摘要	the problem of frequency limitation arising in calibration of the test fixtures is investigated in this paper. it is found that at some frequencies periodically, the accuracy of the methods becomes very low, and. the denominators of the expressions of the required s-parameters approach zero. this conclusion can be drawn whether-the test fixtures, are symmetric or not. a good agreement between theory and experiment is obtained.
英文摘要	the problem of frequency limitation arising in calibration of the test fixtures is investigated in this paper. it is found that at some frequencies periodically, the accuracy of the methods becomes very low, and. the denominators of the expressions of the required s-parameters approach zero. this conclusion can be drawn whether-the test fixtures, are symmetric or not. a good agreement between theory and experiment is obtained.; 于2010-10-29批量导入; made available in dspace on 2010-10-29t06:36:25z (gmt). no. of bitstreams: 1 2794.pdf: 222344 bytes, checksum: 0f3bad756d86eb1c95427955bdb6540e (md5) previous issue date: 2002; chinese inst electr.; ieee microwave theory & techn soc.; ieee electron devices soc.; iee antennas & propagat soc.; electr soc, inst electr, informat & commun engineers japan.; korea inst telemat & electr.; ieee beijing sect.; iee beijing ctr.; ieee mtt s beijing chapter.; cas, state key lab integrated optoelect, inst semicond, beijing 100083, peoples r china
收录类别	CPCI-S
会议主办者	chinese inst electr.; ieee microwave theory & techn soc.; ieee electron devices soc.; iee antennas & propagat soc.; electr soc, inst electr, informat & commun engineers japan.; korea inst telemat & electr.; ieee beijing sect.; iee beijing ctr.; ieee mtt s beijing chapter.
会议录	2002 3rd international conference on microwave and millimeter wave technology proceedings
会议录出版者	ieee ; 345 e 47th st, new york, ny 10017 usa
会议录出版地	345 e 47th st, new york, ny 10017 usa
学科主题	光电子学
语种	英语
ISBN号	0-7803-7486-x
内容类型	会议论文
源URL	[http://ir.semi.ac.cn/handle/172111/13609]
专题	半导体研究所_中国科学院半导体研究所（2009年前）
推荐引用方式 GB/T 7714	Qian C,Wang YL,Chen ZY,et al. Frequency limitation in calibrating microwave test fixtures[C]. 见:3rd international conference on microwave and millimeter wave technology. beijing, peoples r china. aug 17-19, 2002.